Crosslink Summer 2003 Contributors
An Overview of the Space Radiation Environment
Joseph E. Mazur is Research Scientist and section manager in the Space Sciences Department. He joined Aerospace in 1997 and is active in the design and construction of advanced particle detectors and the analysis of effects of the space environment on space systems. He is a coinvestigator on two NASA space science missions and has authored or coauthored more than 40 scientific publications on interplanetary and trapped energetic particles. He is a member of the American Geophysical Union and an associate editor of Geophysical Research Letters. He holds a Ph.D. in physics from the University of Maryland (joseph.mazur@aero.org).
What Could Go Wrong? The Effects of Ionizing Radiation on Space Electronics
Allyson D. Yarbrough, (left) Principal Director, Electronics Engineering Subdivision, leads an organization of nearly 80 employees with expertise applicable to electronics design, modeling and simulation, rapid prototyping, parts management, failure analysis, anomaly resolution, power-systems engineering, electromagnetic compatibility, and on-orbit vulnerabilities. Prior to joining Aerospace in 1989, she served on the Electrical Engineering faculty at California State University, Los Angeles, and held positions at Hewlett-Packard, IBM, and the Arecibo Radio Astronomy Observatory. She earned a Ph.D. in electrical engineering at Cornell University. She holds five patents and is recipient of the Women of Color Technology Award for Career Achievement (allyson.d.yarbrough@aero.org). John Scarpulla (right) is Senior Scientist in the Electronics and Photonics Laboratory. He recently returned to Aerospace after working for Northrop Grumman Space Technology, where he focused on reliability and radiation effects related to advanced integrated circuits. Prior to that, he worked at Texas Instruments/Silicon Systems, investigating hot-carrier and electromigration reliability issues for mixed-signal semiconductors. At Aerospace from 1990 to 1995, he was primarily responsible for radiation-effects testing and analysis and first proposed the approach now known as "radiation hardness by design." He has also worked at SAIC, GE, and RCA, where he performed radiation testing for the Minuteman and MX missile programs as well as hardened circuit design and analysis. He has an M.S.E.E. from the University of Pennsylvania and a Ph.D. in electrical engineering from Cornell University (john.r.scarpulla@aero.org).
Picosecond Lasers for Single-Event Effects Testing
Steven C. Moss (left) is Director of the Microelectronics Technology Department. He also studies radiation effects on microelectronic and optoelectronic devices and materials, investigates ultrafast phenomena, and develops lasers and optical systems. He received an M.S. in physics from Purdue University and a Ph.D. in physics from North Texas State University. He was a National Research Council postdoctoral research associate at the Naval Research Laboratory and visiting assistant professor at North Texas State University prior to joining Aerospace in 1984 (steven.c.moss@aero.org). Stephen D. LaLumondiere (right) has extensive experience with lasers, optics, and electrooptic systems, as well as digital and analog microelectronics. His research activities include pulsed-laser testing of microelectronics for single-event effects, analysis of on-orbit radiation effects on Milsatcom systems, and analysis of radiation effects on advanced charge-coupled devices. LaLumondiere received an A.S. in laser and electrooptics technology from Vincennes University in 1988, when he joined Aerospace (stephen.lalumondiere@aero.org).
Heavy-Ion Testing for Single-Event Effects
Susan Crain (left) came to work at Aerospace in 1982 and has participated in various radiation-effects testing programs over the years. She became the lead engineer for the single-event effects testing program in 1995 and has been heavily involved with the testing since then. She also designed single-event effects experiment boards for the Microelectronics and Photonics Test Bed and the Electronics Test Bed on STRV-1d. She holds a B.S. in engineering from California State University, Northridge (susan.crain@aero.org). Rocky Koga (right) is Distinguished Scientist in the Space Science Applications Laboratory. Since joining Aerospace in 1980, he has investigated the effects of protons, neutrons, and heavy ions on microcircuits and space systems. In studying radiation effects, he has conducted single-event effects tests and experiments at various accelerator sites, including Lawrence Berkeley National Lab, where various single-event phenomena have been discovered. Through those investigations, he has supported the Milstar, Atlas, Titan, IUS, GPS, and other space programs as well as various NASA programs. He has a Ph.D. in physics from the University of California, Riverside (rocky.koga@aero.org).
Designing Integrated Circuits to Withstand Space Radiation
Ronald C. Lacoe, (left) Senior Scientist, Laboratory Operations, is responsible for issues related to the effects of radiation on microelectronic components for space systems. He joined Aerospace in 1987 and has performed research and supported various Air Force programs in the areas of electronic-device and infrared-detector technologies. Prior to joining Aerospace, he worked at Hughes Research Laboratories, developing electrooptical devices. He spent two years with a missile-defense program office, where he was responsible for sensor system definition. Later, as manager of the Microelectronics Reliability and Radiation Effects Section, he focused on the radiation-hardness of commercial microelectronics processes and developed an approach for insertion of hardened-by-design components into military space systems. He holds a Ph.D. from the University of California, Los Angeles (ronald.c.lacoe@aero.org). Donald C. Mayer, (right) Director, Space Electronics Vulnerability Office, provides coordinated support to a variety of DOD and NASA programs involving the design and manufacture of electronic components for the space environment. He has more than 25 years of experience in microelectronic technologies for space applications. He has also been a visiting lecturer in electrical engineering at UCLA for more than 15 years. He holds an M.S. in physics and a Ph.D. in electrical engineering from the University of Michigan. He has been with Aerospace since 1989 (don.mayer@aero.org).
Ground Testing of Spacecraft Materials
Wayne K. Stuckey (left) joined the Aerospace Materials Sciences Laboratory in 1966. He became manager of the Analytical Methods Section in 1976 and head of the Materials Analysis Department in 1982. He was subsequently named Research Scientist and Senior Scientist in the Mechanics and Materials Technology Center. He was selected as a Distinguished Scientist of the Space Materials Laboratory in 1999. He participated in the Effects of Oxygen Interaction with Materials experiments and was a member of the Long Duration Exposure Facility (LDEF) Space Environmental Effects on Materials Special Investigation Group. He also served as investigator on the M0003 Space Environmental Effects on Materials experiment flown by Aerospace on LDEF. He holds a Ph.D. in chemistry from Kansas State University (wayne.k.stuckey@aero.org). Michael J. Meshishnek (right) joined Aerospace in 1981 to work in the Materials Sciences Laboratory. He became manager of the Survivability Section in 1987. He was named Research Scientist in 1993 and Senior Scientist in the Space Materials Laboratory in 2000. His research interests include space environmental effects on materials, testing and modeling of space radiation exposure, and the durability of materials for space systems. He was a participant in the Effects of Oxygen Interaction with Materials experiments and Principal Investigator for the M0003 Space Environmental Effects on Materials experiment, flown by Aerospace on the Long Duration Exposure Facility. He received his Ph.D. in chemistry from the University of California, Santa Barbara (michael.j.meshishnek@aero.org).
