The Aerospace microelectronics radiation effects test facility has both a cobalt-60 gamma-radiation source and an x-ray source. This equipment is used in conjunction with semiconductor parameter analyzers and mixed-signal testers to evaluate radiation-induced performance changes in electronic components according to military standards. The facility has been used to test the sensitivity of electronic devices and circuits fabricated for advanced technology programs and spaceflight hardware over total-dose and dose-rate ranges typical of exposure to the natural space environment. Aerospace is using this system to evaluate the total-dose hardness of test structures and other products built at a number of commercial CMOS foundries to assess their potential for space-qualified manufacturing.