Single-event transients from linear integrated circuits can be captured and registered as logical upsets in digital integrated circuits. The amplitude and width of this transient disturbance is proportional to the amount of charge collected by the sensitive device node. The use of picosecond lasers for this type of testing has aided in explaining the transient behavior of individual transistors in more complex integrated circuits. The three transients depicted here show how a single transistor in a high-speed operational amplifier responds to different amounts of energy deposited by the laser. The greater the amount of deposited energy, the larger the peak amplitude and width of the disturbance. For simplification, the energy deposited by the laser pulse has been normalized to the smallest amplitude transient.