General Information

Microelectronics Reliability & Qualification Workshop

December 2 - 3, 2008

Manhattan Beach Marriott, Manhattan Beach, CA

The Microelectronics Reliability and Qualification Workshop provides a forum for the open discussion on issues of microelectronics reliability and qualification for microelectronics targeted for use in space systems. This year the format will consist of several main technical sessions with keynote speakers each day.

We are pleased to announce our keynote presentations at this year's conference:

• December 2 - "Qualification Issues and Pitfalls for Advanced Semiconductor Devices in Space" - David Sunderland, Boeing Technical Fellow, Boeing Satellite Development Center
  
• December 3 - "Advanced, Non-Destructive Defect Localization in Microelectronics" - Ed Cole, Sandia Senior Scientist, Sandia National Laboratories

Expert invited speakers will cover the latest results or work in progress in different areas of microelectronics device reliability and qualification methodologies including:

• Advanced technologies reliability issues
• Product qualification methodology
• Advanced space microprocessors and memories
• RF, analog and mixed-signal device & design issues
• Space radiation effects
• FPGA reliability and qualification issues
• Hardness-by-design
• Designing in reliability
• Reliability for extreme environments
• Advanced packaging issues

Workshop Chair

Ronald Lacoe
The Aerospace Corporation
(310) 336-0118
ronald.c.lacoe@aero.org

Sponsored by The Aerospace Corporation, the Jet Propulsion Laboratory, and NASA